Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry.

Polarizer-surface-analyzer null ellipsometry for film-substrate systems

Ellipsometry with polarisation analysis at cryogenic temperatures inside a vacuum chamber.

In this paper we describe a new variant of null ellipsometry to determine thicknesses and optical properties of thin films on a substrate at cryogenic temperatures. In the PCSA arrangement of ellipsometry the polarizer and the compensator are placed before the substrate and the analyzer after it. Usually, in the null ellipsometry the polarizer and the analyzer are rotated to find the searched m...

Transmissive liquid crystal cell parameters measurement by spectroscopic ellipsometry

A powerful method for liquid crystal ~LC! cell twist angle and retardation measurement is presented. This method is based on the spectroscopic ellipsometry. By varying the polarizer and analyzer angles only, a transmission spectrum containing null transmission at some particular wavelengths can be obtained. Analytical equations derived bases on a polarization analysis of twisted birefringent la...

Optical Rotatory Dispersion Measurement of D-Glucose with Fixed Polarizer Analyzer Accessory in Conventional Spectrophotometer

In the sample compartment of a conventional spectrophotometer, mounting of a polarizer before sample and an analyzer behind sample allows the determination of the optical rotatory dispersion of optical active media by measurement of the transmission ratio of crossed and parallel arranged polarizer and analyzer. A formula for the determination of the angle of rotation is derived from the transmi...

Ellipsometer nulling: convergence and speed.

The process of nulling in ellipsometry is studied by a graphical presentation using the trajectories of two significant polarization states in the complex plane, (XPC) and (XSA). These states are determined by (1) the polarizer and compensator ((XPC)) and (2) the specimen and the analyzer ((XSA)) in the polarizer-compensator-specimen-analyzer ellipsometer arrangement. As the azimuth angles of t...